bib: 1000200

This data as json

bib_record_num	bib_record_id	control_numbers	isbn_values	best_author	best_title	publisher	publish_year	bib_level_callnumber	indexed_subjects	genres	item_types	cataloging_date
1000200	420907795208	[ "oc 00671381", "ocolc 13327973" ]	[ "0070653410" ]	Tsui, Frank F.	LSI/VLSI testability design	McGraw-Hill,	1987	r621.395 87	[ "integrated circuits large scale integration testing", "large scale integration integrated circuits testing", "testing integrated circuits large scale integration", "integrated circuits very large scale integration testing", "testing integrated circuits very large scale integration", "very large scale integration integrated circuits testing" ]		[ "Reference Book" ]	1992-03-22

bib_record_num

bib_record_id

control_numbers

isbn_values

best_author

best_title

publisher

publish_year

bib_level_callnumber

indexed_subjects

genres

item_types

cataloging_date

1000200

420907795208

[
    "oc 00671381",
    "ocolc 13327973"
]

[
    "0070653410"
]

Tsui, Frank F.

LSI/VLSI testability design

McGraw-Hill,

1987

r621.395 87

[
    "integrated circuits large scale integration testing",
    "large scale integration integrated circuits testing",
    "testing integrated circuits large scale integration",
    "integrated circuits very large scale integration testing",
    "testing integrated circuits very large scale integration",
    "very large scale integration integrated circuits testing"
]

[
    "Reference Book"
]

1992-03-22